Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Laser beam profiler — A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers ultraviolet, visible, infrared, continuous… … Wikipedia
Angular resolution — describes the resolving power of any image forming device such as an optical or radio telescope, a microscope, a camera, or an eye. Definition of terms Resolving power is the ability of the components of an imaging device to measure the angular… … Wikipedia
Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… … Wikipedia
ECHIDNA - High Resolution Powder Diffractometer — ECHIDNA is the name of the new neutron High Resolution Powder Diffractometer at Australia s new research reactor OPAL, ANSTO. The instrument serves to determine the crystalline structures of materials using neutron radiation analogical to X ray… … Wikipedia
High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… … Wikipedia
radar resolution — The ability to distinguish between two closely spaced targets. The distance between two resolvable targets must be defined in each of the dimensions of measurement, which typically for a radar are range, azimuth, elevation, and velocity. Range… … Aviation dictionary
Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
TIV MPI Resolution — MPI Resolution installing wind turbines. Career CY Name: Mayflower Resolution (2003 04) Resolution (from 2004) … Wikipedia
Ion beam analysis — ( IBA ) is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near surface layer of solids. All IBA methods are highly sensitive and allow the … Wikipedia